The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Dec. 17, 2002
Kazuhiro Sakaguchi, Tokyo, JP;
Kazuhiro Sakaguchi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A method of detecting a failure in an IC, based on spectrum which is a result of analyzing a frequency of a current running through an IC when a test signal is applied to the IC, including (a) assuming that all ICs under test define a under-test IC set, and testing each one of the ICs in the under-test IC set in a conventional manner; (b) removing ICs judged to be in failure in (a), from the under-test IC set; (c) measuring spectrum of a current supplied from a power source into each one of the ICs in the under-test IC set; (d) calculating both a mean value and standard deviation of the spectrum for the under-test IC set; (e) judging whether an IC is in failure, based on both the mean value and the standard deviation of the spectrum; (f) removing ICs judged to be in failure in (e), from the under-test IC set; and (g) judging the undertest IC set to be in no failure.