The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2002
Filed:
Aug. 02, 1999
Kazuhiro Sakaguchi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In an LSI testing apparatus, a test sequence generator produces at least one sequence of test signals each having a different test pattern. A source current sensor detects a source current flowing from a power voltage source to an integrated circuit device under test when the device is subjected to the sequence of test signals. Counter circuitry defines a window period equal to at least one sequence of the test signals. Analog-to-digital converter circuitry is activated during the window period to sample the source current and quantize sampled values of the source current to digital samples. A discrete Fourier transform analyzer analyzes the digital samples to produce a number of spectral values at frequencies k/T, where T represents the period of said sequence and k is an integer equal to or greater than unity. Decision circuitry makes a decision on the analyzed spectral values using a plurality of reference spectral values.