The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Aug. 07, 2003
Yutaka Yoshizawa, Kanagawa, JP;
Kazuhiro Sakaguchi, Kanagawa, JP;
Yutaka Yoshizawa, Kanagawa, JP;
Kazuhiro Sakaguchi, Kanagawa, JP;
NEC Electronics Corporation, Kanagawa, JP;
Abstract
An observation apparatus according to one embodiment can include a timing generating unit () that generates a timing signal at a predetermined period. A sampling unit () can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit (). A data number adjusting unit () can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit () can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.