Kara L Sherman

Title: Innovations by Kara L Sherman

Introduction

Kara L Sherman is a prominent inventor based in Milpitas, CA (US). She has made significant contributions to the field of semiconductor technology, holding a total of 4 patents. Her work focuses on improving the reliability and efficiency of semiconductor devices through innovative testing methods.

Latest Patents

One of her latest patents is titled "Systems and methods for semiconductor adaptive testing using inline defect part average testing." This invention is designed to receive a plurality of inline defect part average testing (I-PAT) scores from an I-PAT system. The system generates these scores based on semiconductor die data for a variety of semiconductor dies. Each I-PAT score represents a weighted defectivity determined by the I-PAT system based on characterization measurements of corresponding semiconductor dies. The invention applies one or more rules to the I-PAT scores during a dynamic decision-making process and generates adaptive tests for at least one semiconductor die based on this process.

Another notable patent is the "System and method for identifying latent reliability defects in semiconductor devices." This invention is configured to perform stress tests on a plurality of wafers received from in-line sample analysis tools. It determines a passing set and a failing set of wafers, performs reliability hit-back analysis on the failing set, and analyzes the results to identify geographic locations of die fail chains caused by latent reliability defects.

Career Highlights

Kara has worked with notable companies in the semiconductor industry, including Kla Corporation and Kla Tencor Corporation. Her experience in these organizations has contributed to her expertise in semiconductor technology and innovation.

Collaborations

Throughout her career, Kara has collaborated with esteemed colleagues such as David W Price and Robert J Rathert. These collaborations have further enhanced her contributions to the field.

Conclusion

Kara L Sherman is a trailblazer in semiconductor innovation, with a focus on adaptive testing and reliability defect identification. Her patents reflect her commitment to advancing technology in this critical field.