Jun Hirota

Title: Innovations by Jun Hirota

Introduction

Jun Hirota is a notable inventor based in Kanagawa-ken, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 11 patents. His work focuses on advanced measurement devices and methods that enhance the understanding and functionality of semiconductors.

Latest Patents

Hirota's latest patents include a semiconductor measurement device and a method of measuring semiconductors. The semiconductor measurement device features an electrode integrated into a semiconductor sample, along with a probe that can make contact with the sample. A driver is employed to adjust the contact position of the probe, while a power supply applies electric power between the probe and the electrode. The measurement operation portion is designed to measure the current flowing through the semiconductor sample as the voltage between the probe and the electrode is varied. This operation allows for the measurement of current at multiple points on the semiconductor surface, either by scanning or sequentially contacting the probe with these points. Additionally, he has developed a measuring method for scanning probe microscopy that utilizes a penetrative pressing force, allowing for precise measurements of physical properties at varying depths.

Career Highlights

Throughout his career, Jun Hirota has worked with prominent companies such as Toshiba Corporation and Toshiba Memory Corporation. His experience in these organizations has contributed to his expertise in semiconductor technologies and innovations.

Collaborations

Hirota has collaborated with notable colleagues, including Moto Yabuki and Yoko Iwakaji, who have contributed to his research and development efforts.

Conclusion

Jun Hirota's innovative work in semiconductor measurement devices and methods showcases his significant impact on the field. His contributions continue to advance the understanding and application of semiconductor technology.