Seoul, South Korea

Jong Hui Lee

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 4.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019-2020

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5 patents (USPTO):Explore Patents

Title: Innovations of Jong Hui Lee

Introduction

Jong Hui Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of inspection systems and methods, holding a total of 5 patents. His work focuses on enhancing the precision and effectiveness of defect inspections in various items.

Latest Patents

One of his latest patents is an inspection system and method that performs image processing on the outline of an inspection object. This system determines whether the object is good or defective by overlapping the image-processed outline with reference information. The system includes a data acquisition unit that captures images of the inspection object, a processing unit that detects the outline based on the image data, and an output unit that displays the processed outline with reference information. Another notable patent is an item inspecting device that consists of an image obtaining section and a control section. This device captures images of items and determines defects by inspecting various elements such as position, shape, and size, as well as foreign substance adhesion and surface stains.

Career Highlights

Jong Hui Lee is currently employed at Koh Young Technology Inc., where he continues to innovate in the field of inspection technologies. His work has significantly advanced the capabilities of defect detection systems, making them more reliable and efficient.

Collaborations

He collaborates with talented coworkers, including Seung Ae Seo and Won Mi Ahn, who contribute to the development of cutting-edge inspection technologies.

Conclusion

Jong Hui Lee's contributions to inspection systems and methods demonstrate his commitment to innovation and excellence in technology. His patents reflect a deep understanding of image processing and defect detection, positioning him as a key figure in his field.

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