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Seoul, South Korea

Koh Young Technology Inc.

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USPTO Granted Patents = 178

% Expired Patents = 0.56

EPO Patents = 105

Trademarks = 6

Forward Citations = 247

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172 inventors (with patents filed for the assignee):

Seung-Jun Lee (19 out of 70 patents)

Joong-Ki Jeong (19 out of 19 patents)

Moon Young Jeon (16 out of 16 patents)

4. Deok Hwa Hong (16 out of 16 patents)

5. Jung Hur (15 out of 15 patents)

6. Moon-Young Jeon (13 out of 13 patents)

7. Duk Young Lee (11 out of 11 patents)

8. Min-young Kim (11 out of 15 patents)

9. Hyun Ki Lee (10 out of 11 patents)

10. Sang-Kyu Yun (10 out of 10 patents)

11. Hong-Min Kim (10 out of 10 patents)

12. Min Young Kim (10 out of 27 patents)

13. Jin Man Kang (9 out of 9 patents)

14. Bong-Ha Hwang (9 out of 9 patents)

15. Chan Kwon Lee (8 out of 9 patents)

Core Competencies:

3D Imaging

Medical Inspection

Optical Tracking

Computed Tomography

Surgical Robotics

Biological Tissue

Substrate Inspection

Component Mounting

Image Matching

Focus-Less Inspection

Solder Inspection

Pattern Light Projection

178 patents: Sort by Forward Citations

1. 12743773 - Method and apparatus for determining mid-sagittal plane in magnetic resonance images (2026-09-22),

2. 12729957 - Apparatus and method for determining three-dimensional shape of object (2026-09-08),

3. 12708288 - PORTABLE THREE-DIMENSIONAL IMAGE MEASURING DEVICE, THREE-DIMENSIONAL IMAGE MEASURING METHOD USING SAME, AND MEDICAL IMAGE MATCHING SYSTEM (2026-08-18),

4. 12678880 - Device and method for optimizing control parameter of solder printing apparatus (2026-07-14),

5. 12639799 - Flipper apparatus and object inspection method using same (2026-05-26),

6. 12616550 - Medical three-dimensional image measuring device and medical image matching system (2026-05-05),

7. 12322086 - Apparatus, method and recording medium for inspecting coating state of object coated on substrate (2025-06-03),

8. 12318188 - Portable three-dimensional image measuring device, three-dimensional image measuring method using same, and medical image matching system (2025-06-03),

9. 12309916 - Method of verifying fault of inspection unit, inspection apparatus and inspection system (2025-05-20),

10. 12279897 - Computed tomography apparatus and method using plurality of light sources (2025-04-21),

11. 12193802 - Blood flow measurement device and blood flow measurement method (2025-01-14),

12. 12163776 - Apparatus and method for measuring a three-dimensional shape (2024-12-10),

13. 12161457 - Optical tracking system for tracking a patient and a surgical instrument with a reference marker and shape measurement device via coordinate transformation (2024-12-10),

14. 12146734 - Apparatus and method for determining three-dimensional shape of object (2024-11-19),

15. 12135204 - Apparatus and method for determining three-dimensional shape of object (2024-11-05),

Company Overview

Koh Young Technology Inc., based in Seoul, South Korea, specializes in advanced medical imaging technologies. The company focuses on developing innovative solutions in 3D imaging, optical tracking, and computed tomography, enhancing the precision of medical inspections and surgical procedures. Koh Young's expertise extends to surgical robotics and biological tissue analysis, as well as substrate inspection and component mounting, positioning it as a leader in the medical technology sector.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

178 Patents

#51 in Seoul

#126 in South Korea

#4,689 in the World

Seoul, South Korea

Koh Young Technology Inc.

Forward Citations = 247

172 inventors:

Seung-Jun Lee (19 out of 70 patents)

Joong-Ki Jeong (19 out of 19 patents)

Moon Young Jeon (16 out of 16 patents)

4. Deok Hwa Hong (16 out of 16 patents)

5. Jung Hur (15 out of 15 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Koh Young Technology Inc.. Retrieved from https://idiyas.com/company/koh-young-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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