The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Mar. 10, 2023
Koh Young Technology Inc, Seoul, KR;
Uif (University Industry Foundation), Yonsei University, Seoul, KR;
Chul Min Joo, Goyang-si, KR;
Baek Cheon Seong, Seoul, KR;
KOH YOUNG TECHNOLOGY INC, Seoul, KR;
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY, Seoul, KR;
Abstract
A three-dimensional shape measurement apparatus, according to an embodiment, comprises: a projector configured to emit patterned light onto the object; and an imaging device configured to image the object, including an optical system, that includes at least one lens defining an optical axis and a binary phase filter disposed on the optical axis of the optical system so as to transmit light, and configured to form an image by using light that has passed through the at least one lens and the binary phase filter. The binary phase filter may include: a first portion comprising at least one pattern extending circumferentially around the optical axis; and a second portion distinct from the first portion, wherein the first portion and the second portion have different thicknesses in an optical axis direction that is parallel to the optical axis.
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