Joong-Ki Jeong

Title: Joong-Ki Jeong: Innovator in Substrate Inspection Technologies

Introduction

Joong-Ki Jeong, based in Seoul, South Korea, is a notable inventor with an impressive portfolio of 19 patents. His work primarily focuses on advancements in inspection methods for substrates, particularly within the technology and manufacturing sectors.

Latest Patents

Among Joong-Ki Jeong's most recent innovations is a patent titled "Method and apparatus of inspecting a substrate with a component mounted thereon." This invention provides a streamlined approach to verify whether components are correctly affixed to substrates without necessitating further adjustments or changes in inspection conditions. The method employs a three-dimensional shape measurement technique by projecting a pattern image onto the substrate using an illumination unit, capturing a reflected image through an imaging unit, and identifying a shield region to analyze potential mounting defects comprehensively.

Another significant patent introduced by Jeong is a "Shape measurement apparatus and method." This apparatus comprises a work stage that supports the target substrate and incorporates a pattern-projecting section with a light source and a grating part, which together generate a grating image that is projected onto the measurement target. The system captures reflected images to calculate a reliability index and phases of the grating image, thereby enhancing the measurement accuracy significantly.

Career Highlights

Joong-Ki is currently employed at Koh Young Technology Inc., an esteemed organization in the field of technology and innovation. His contributions to the company have solidified his reputation as a leader in developing advanced inspection technologies tailored to the needs of modern manufacturing processes.

Collaborations

Jeong has collaborated with esteemed colleagues in his endeavors, including fellow inventors Seung-Jun Lee and Yu-Jin Lee. Their combined efforts have led to groundbreaking advancements in substrate inspection and measurement technologies, further establishing their influence in the industry.

Conclusion

Joong-Ki Jeong's innovative methods and apparatuses have transformed the way substrate inspection is conducted, showcasing his expertise and commitment to precision in technology. His patents not only advance inspection methodologies but also contribute to the reliability and efficiency of component assembly across various industries.