The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 29, 2013
Applicant:
Koh Young Technology Inc., Seoul, KR;
Inventors:
Joong-Ki Jeong, Seoul, KR;
Yu-Jin Lee, Seoul, KR;
Seung-Jun Lee, Seoul, KR;
Bong-Ha Hwang, Seoul, KR;
Assignee:
KOH YOUNG TECHNOLOGY INC., Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01R 31/309 (2006.01); G01B 11/25 (2006.01); G06T 7/00 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/309 (2013.01); G01B 11/2531 (2013.01); G06T 7/0057 (2013.01);
Abstract
An inspection method includes photographing a measurement target to acquire image data for each pixel of the measurement target, acquiring height data for each pixel of the measurement target, acquiring visibility data for each pixel of the measurement target, multiplying the acquired image data by at least one of the height data and the visibility data for each pixel to produce a result value, and setting a terminal area by using the produced result value. Thus, the terminal area may be accurately determined.