The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2020
Filed:
Jun. 30, 2016
Koh Young Technology Inc., Seoul, KR;
Young Heon Bae, Seoul, KR;
Seung Jun Lee, Seongnam-si, KR;
Jeong Yeob Kim, Icheon-si, KR;
Deok Hwa Hong, Gwangmyeong-si, KR;
Moon Young Jeon, Seongnam-si, KR;
Joon Koo Kang, Bucheon-si, KR;
Joongki Jeong, Gwangmyeong-si, KR;
Jae Yoon Jung, Seoul, KR;
Jong Hui Lee, Seoul, KR;
KOH YOUNG TECHNOLOGY INC., Seoul, KR;
Abstract
An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.