Young Heon Bae

Title: Young Heon Bae: Innovator in Item Inspection Technology

Introduction

Young Heon Bae is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of item inspection technology. His innovative approach has led to the development of a unique patent that enhances the precision and effectiveness of defect inspections.

Latest Patents

Young Heon Bae holds a patent for an item inspecting device. This apparatus includes an image obtaining section and a control section. The image obtaining section captures an image of at least a part of an item. The control section determines whether the item is defective by analyzing the captured image. It performs a first inspection for position, shape, and size concerning predetermined elements on the item. Additionally, it conducts a second inspection for foreign substance adhesion, scratches, and surface stains. This technology allows for more precise and effective defect inspections.

Career Highlights

Young Heon Bae is associated with Koh Young Technology Inc., a company known for its advancements in inspection technology. His work has contributed to the company's reputation as a leader in the industry. He has been instrumental in developing innovative solutions that address the challenges of item inspection.

Collaborations

Young Heon Bae collaborates with talented coworkers, including Seung Jun Lee and Jeong Yeob Kim. Together, they work on projects that push the boundaries of technology in the inspection field.

Conclusion

Young Heon Bae's contributions to item inspection technology exemplify his innovative spirit and dedication to improving industry standards. His patent and work at Koh Young Technology Inc. highlight his role as a key player in advancing inspection solutions.