Koh Young Technology Inc.

Young Heon Bae

Seung Jun Lee

Deok Hwa Hong

Moon Young Jeon

Jong Hui Lee

Jae Yoon Jung

Joongki Jeong

Jeong Yeob Kim

Joon Koo Kang

An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.

Item inspecting device

Growing community of inventors

Seoul, South Korea

Young Heon Bae