Koh Young Technology Inc.

Jong Hui Lee

Seung Ae Seo

Won Mi Ahn

Hye In Lee

Yeon Hee Lee

Seung Jun Lee

Deok Hwa Hong

Moon Young Jeon

Jae Yoon Jung

Joongki Jeong

Jeong Yeob Kim

Joon Koo Kang

Young Heon Bae

Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Inspection system and inspection method

An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.

Item inspecting device

A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.

Substrate inspection method and system

Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.

Substrate inspection apparatus and method

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Seoul, South Korea

Jong Hui Lee