Johnny James LeBlanc

Title: Johnny James LeBlanc: Innovator in Test Pattern Compression and High-Speed Testing

Introduction

Johnny James LeBlanc is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of integrated circuits and testing methodologies. With a total of 11 patents to his name, LeBlanc has demonstrated a commitment to innovation and excellence in his work.

Latest Patents

One of LeBlanc's latest patents is focused on test pattern compression. This method generates a first test pattern comprising a plurality of bits and identifies bits with a don't-care bit value. It replaces these identified bit values with random bit values to create a second test pattern. The method then determines the fault coverage level of the second test pattern. If this level exceeds a predetermined individual test pattern fault coverage level, the method exchanges the don't-care value in the first test pattern with the corresponding bit value in the second test pattern. This innovative approach merges subsequent test patterns that enhance fault coverage.

Another significant patent by LeBlanc is a method and apparatus for testing path delays in a high-speed boundary scan implementation. This invention addresses limitations imposed by pipelined high-speed clocking architectures in integrated circuits. It features a special phase hold circuit that allows for proper clocking during dynamic tests, ensuring accurate results when the integrated circuit is clocked with a high-speed distributed clock. The functional logic clock enable is pipelined to synchronize the functional mode clock with the test mode clock when switching modes.

Career Highlights

LeBlanc is currently employed at International Business Machines Corporation (IBM), where he continues to push the boundaries of technology and innovation. His work has had a profound impact on the efficiency and effectiveness of testing methodologies in the industry.

Collaborations

Throughout his career, LeBlanc has collaborated with talented individuals such as Timothy Michael Skergan and Timothy B Brodnax. These collaborations have further enriched his contributions to the field.

Conclusion

Johnny James LeBlanc is a distinguished inventor whose work in test pattern compression and high-speed testing has made a significant impact on the technology landscape. His innovative patents and collaborations reflect his dedication to advancing the field of integrated circuits.