The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1999
Filed:
Mar. 14, 1997
Johnny James LeBlanc, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for performing non-standard insitu burn-in testings is disclosed. In accordance with the method and system of the present invention, a transition counter is provided for each of the integrated-circuit (IC) devices under test. A set of scan strings is transmitted to the transition counter in each of the IC devices while the IC devices are operating under a high-temperature /high-voltage environment. A determination is then made as to whether or not a value from the transition counter in each of the IC devices operating under the high-temperature environment is within a predefined range in response to the transmitted scan strings. An indicator associated with each of the IC devices operating under the high-temperature/high-voltage environment is set in response to the transition counter value that occurred outside the predefined range. The IC devices that do not have the indicator set are subsequently tested again with the IC devices operating in room temperature and nominal voltage. Each IC device that passes the second test will be accepted.