The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Jan. 15, 2009
Patrick R. Crosby, Austin, TX (US);
Daniel W. Cervantes, Round Rock, TX (US);
Johnny J. Leblanc, Austin, TX (US);
Samuel I. Ward, Round Rock, TX (US);
Patrick R. Crosby, Austin, TX (US);
Daniel W. Cervantes, Round Rock, TX (US);
Johnny J. LeBlanc, Austin, TX (US);
Samuel I. Ward, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for test pattern compression generates a first test pattern comprising a plurality of bits. The method identifies bits comprising a don't-care bit value in the first test pattern and replaces the identified bit values with random bit values, to generate a second test pattern. The method determines a fault coverage level of the second test pattern. In the event the determined fault coverage level of the second test pattern exceeds a predetermined individual test pattern fault coverage level, for at least one bit position in the second test pattern corresponding to a replaced identified bit value and detecting at least one fault, the method exchanges the don't care value in the bit position in the first test pattern with the bit value in the corresponding bit position in the second test pattern. The method merges subsequent test patterns that increase fault coverage with the second test pattern.