This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2011-2012.
Company Filing History:
Years Active: 2011-2012
Title: Innovations by Patrick R. Crosby
Introduction
Patrick R. Crosby is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of technology, particularly in the area of test pattern generation and diagnostics. With a total of 2 patents, his work has had a notable impact on the industry.
Latest Patents
Crosby's latest patents include innovative methods for test pattern compression and scan chain fail diagnostics. The first patent, titled "Test Pattern Compression," describes a method that generates a first test pattern comprising a plurality of bits. This method identifies bits with a don't-care bit value and replaces them with random bit values to create a second test pattern. It then determines the fault coverage level of the second test pattern and merges subsequent test patterns that enhance fault coverage.
The second patent, "Scan Chain Fail Diagnostics," involves generating a test pattern for a device under test (DUT) that includes multiple scan chains. This method identifies faults detected by multiple input shift registers (MISRs) and couples them as an independent MISR pair if their detected faults do not overlap. The test pattern is applied to the DUT to generate a scan chain output, which is then compared with a known good signature.
Career Highlights
Patrick R. Crosby is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of testing and diagnostics in electronic devices.
Collaborations
Crosby has collaborated with notable coworkers, including Samuel I. Ward and William David Ramsour. Their combined expertise has contributed to the successful development of innovative solutions in their field.
Conclusion
Patrick R. Crosby's contributions to technology through his patents and work at IBM highlight his role as a significant inventor in the industry. His innovative methods for test pattern generation and diagnostics continue to influence advancements in electronic testing.