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For the Inventor, By the Inventor

Schriesheim, Germany

Joachim Bradl

This inventor holds 15 USPTO granted patents and 6 published patent applications and 5 EPO patents, primarily in Imaging Systems. Top assignees: Leica Microsystems Cms Gmbh, Leica Microsystems Heidelberg Gmbh, Ruprecht Karts Universitaet Heidelberg. Active years: 2002-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joachim Bradl. Retrieved from https://idiyas.com/inventor/joachim-bradl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 15 

% Patents Active = 86.7

 

Average Co-Inventor Count = 2.5

ph-index = 5

Forward Citations = 93(Granted Patents)


Location History:

  • Schriesheim, DE (2002 - 2008)
  • Viernheim, DE (2020)

Company Filing History:

goldMedal8 out of 551 
 
Leica Microsystems Cms Gmbh
 patents
silverMedal5 out of 120 
 
Leica Microsystems Heidelberg Gmbh
 patents
bronzeMedal1 out of 1 
 
Ruprecht Karts Universitaet Heidelberg
 patent
4. 1 out of 834,601 
Other
 patents

Years Active: 2002-2026

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Areas of Expertise:
Imaging System
Optical Recognition
Laser Scanning
Illumination Arrangement
Microscope
Data Storage
Oligonucleotide Nanostructure
Beam Deflection
Distance Measurement
Light Sheet Microscope
Wave Field Microscope
Spectrally Selective Element
15 patents (USPTO):Explore Patents
1. 12769104 - Imaging system comprising a sample moving unit and at least one illumination optic and imaging method (2026-10-20),
2. 12694527 - Method and imaging system for matching images of discrete entities (2026-07-28),
3. 12693204 - Method and device for optically recognizing a discrete entity from a plurality of discrete entities (2026-07-28),
4. 12674745 - Sample carrier and method for imaging a sample (2026-07-07),
5. 12347527 - Data storage device and method for storing data using an oligonucleotide nanostructure backbone and labels with dyes (2025-07-01),
6. 10866396 - Illumination arrangement for a light sheet microscope (2020-12-15),
7. 7342717 - Wave field microscope with detection point spread function (2008-03-11),
8. 7031055 - Microscope (2006-04-18),
9. 7002717 - Apparatus for beam deflection (2006-02-21),
10. 6740868 - Scanning microscope and a method of scanning a specimen (2004-05-25),
11. 6678089 - Microscope (2004-01-13),
12. 6654165 - Optical arrangement (2003-11-25),
13. 6614525 - Laser scanning microscope with single wavelength excitation (2003-09-02),
14. 6510001 - Optical arrangement with a spectrally selective element (2003-01-21),
15. 6424421 - Method and devices for measuring distances between object structures (2002-07-23),

Title: Innovator Spotlight: Joachim Bradl - The Mind Behind Cutting-Edge Microscopy Patents

Introduction: Meet Joachim Bradl, a prolific inventor hailing from Schriesheim, Germany, with a noteworthy track record of 10 patents under his belt.

Latest Patents: Among his recent inventions is an "Illumination arrangement for a light sheet microscope," revolutionizing sample illumination in microscopy, and a "Wave field microscope with detection point spread function," enhancing microscopy capabilities for nuanced distance measurements and DNA sequencing.

Career Highlights: Joachim Bradl showcased his expertise at renowned companies like Leica Microsystems Heidelberg GmbH and Leica Microsystems CMS GmbH, contributing significantly to advancements in microscopy technology.

Collaborations: Along his professional journey, Bradl collaborated closely with accomplished peers such as Johann Engelhardt and Michael Hausmann, playing a pivotal role in pioneering cutting-edge microscopy solutions.

Conclusion: Joachim Bradl's dedication to innovation and his trailblazing contributions to microscopy technology underscore his status as a visionary inventor in the field. His patents continue to shape the landscape of scientific research and technological advancement, solidifying his legacy as a key player in the realm of microscopy innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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