The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Sep. 30, 2022
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Soeren Alsheimer, Wetzlar, DE;
Joachim Bradl, Wetzlar, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/33 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G01N 21/05 (2013.01); G01N 21/645 (2013.01); G02B 21/0076 (2013.01); G02B 21/33 (2013.01); G02B 21/34 (2013.01); G01N 2021/6482 (2013.01);
Abstract
A sample carrier for receiving a sample includes an optical medium in which the sample is received, the optical medium having a first refractive index. A window portion defining two parallel surfaces includes an optically transparent material having a second refractive index, and is arranged at a bottom side of the sample carrier. The first and second refractive indices do not deviate by more than 2.5%.