The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2006

Filed:

Nov. 20, 2000
Applicants:

Rafael Storz, Heidelberg, DE;

Johann Engelhardt, Bad Schoenborn, DE;

Holger Birk, Meckesheim, DE;

Joachim Bradl, Schriesheim, DE;

Inventors:

Rafael Storz, Heidelberg, DE;

Johann Engelhardt, Bad Schoenborn, DE;

Holger Birk, Meckesheim, DE;

Joachim Bradl, Schriesheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns an apparatus for beam deflection, in particular for scanning microscopy, a light beam being deflectable by a mirror arrangement that is alternatingly rotatable by a rotary drive. The apparatus for beam deflection makes possible maximum variability in terms of frequency range and maximally achievable oscillation frequency, and is thus usable in flexible and versatile fashion. It moreover allows almost any desired angular offset from the zero point position to be established, and is characterized in that the rotary drive comprises two mutually independent drive units which rotate the mirror arrangement, together or mutually independently, about a rotation axis.


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