The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
Nov. 28, 2000
Applicant:
Inventors:
Werner Knebel, Kronau, DE;
Joachim Bradl, Schriesheim, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 ; G01J 3/30 ;
U.S. Cl.
CPC ...
H01J 3/14 ; G01J 3/30 ;
Abstract
A method and a scanning microscope for application of the method for optical-light scanning of a specimen; preferably in scanning microscopy, in particular in confocal laser scanning microscopy, the intensity of the light being regulated, is characterized, in order to optimize signal yield already during the actual data recording or measurement, in that regulation is accomplished as a function of the current focus position in the specimen region of the scanned, focused light beam.