The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Nov. 20, 2000
Johann Engelhardt, Bad Schoenborn, DE;
Joachim Bradl, Schriesheim, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A laser scanning microscope, preferably a confocal laser scanning microscope, having a laser light source for illuminating a specimen and a detector for detecting the light returning from the specimen, the specimen or parts thereof. The specimen is marked with markers that can be excited to emit. For the specific detection of preferably biological specimen structures, with high localization accuracy for the specimen structures, the laser light source emits exciting light substantially at one wavelength. Different markers emit light of different wavelengths, when irradiated with exciting light of substantially the same wavelength. The detector is embodied as a multi-band detector for the simultaneous detection of light at several wavelengths. A corresponding method for the detection of preferably biological specimens or specimen structures by laser scanning microscopy is described.