The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Apr. 13, 2000
Johann Engelhardt, Bad Schoenborn, DE;
Joachim Bradl, Schriesheim, DE;
Leica Microsystems Heidelberg GmbH, Heidelberg, DE;
Abstract
A microscope ( ), preferably a confocal laser scanning microscope, having at least one light source, a detector, and two objectives ( ), one of the objectives ( ) being arranged on each of the two sides of the specimen plane ( ) and the objectives ( ) being directed toward one another and having a common focus; and at least one beam splitter ( ) for distributing the illuminating light ( ) to the objectives ( ), and a beam recombiner ( ) for combining the detected light ( ) coming from the objectives ( ), being provided in the illumination/detection beam path ( ), is characterized, for selectable, subsequent implementation of ultrahigh-resolution microscope techniques, in that the objectives ( ) and the beam splitter/beam recombiner ( ) are grouped into a modular assembly ( ); and the assembly ( ) has an interface ( ) for connection to the illumination/detection beam path ( ) of the microscope ( ).