Jing Sun

Title: Innovations by Jing Sun in On-Wafer Calibration Technologies

Introduction

Jing Sun is a notable inventor based in Shijiazhuang, China, recognized for his contributions to the field of on-wafer calibration technologies. With a total of four patents to his name, he has made significant advancements that enhance the accuracy and efficiency of calibration processes in electronic devices.

Latest Patents

One of Jing Sun's latest patents is titled "Method for determining parameters in on-wafer calibration piece model." This innovative method involves constructing an on-wafer calibration piece model set that includes multiple models, each corresponding to a specific calibration piece. The process includes selecting a model, measuring the calibration piece using a specialized S parameter measurement system, and calculating various parameters that represent crosstalk in the model. Another significant patent is the "Two-port on-wafer calibration piece circuit model and method for determining parameters." This patent outlines a method for measuring and calculating intrinsic and parasitic values in two-port calibration models, which is crucial for accurate performance assessments in terahertz frequency bands.

Career Highlights

Jing Sun has worked with prominent organizations, including the 13th Research Institute of China Electronics Technology Group Corporation and Hebei Sinopack Electronic Tech Co., Ltd. His experience in these institutions has allowed him to develop and refine his innovative techniques in calibration technologies.

Collaborations

Throughout his career, Jing Sun has collaborated with several professionals, including Aihua Wu and Yibang Wang. These collaborations have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Jing Sun's work in on-wafer calibration technologies showcases his innovative spirit and dedication to improving electronic measurement processes. His patents reflect a deep understanding of the complexities involved in calibration, making significant contributions to the field.