The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Dec. 16, 2020
Applicant:

The 13th Research Institute of China Electronics Technology Group Corporation, Shijiazhuang, CN;

Inventors:

Yibang Wang, Shijiazhuang, CN;

Aihua Wu, Shijiazhuang, CN;

Faguo Liang, Shijiazhuang, CN;

Chen Liu, Shijiazhuang, CN;

Peng Luan, Shijiazhuang, CN;

Ye Huo, Shijiazhuang, CN;

Jing Sun, Shijiazhuang, CN;

Yanli Li, Shijiazhuang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3586 (2014.01); G01N 27/02 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01N 21/3563 (2013.01); G01N 27/026 (2013.01); G01N 2021/3568 (2013.01);
Abstract

A calibration method includes: acquiring eight error models obtained after a preliminary calibration of a Terahertz frequency band system; based on the eight error models, determining a first mathematical model according to a first S parameter related to a first calibration piece, the first mathematical model comprising parallel crosstalk terms between probes, and determining a second mathematical model according to a second S parameter related to a second calibration piece, the second mathematical model comprising series crosstalk terms between the probes; determining a third mathematical model according to a third S parameter related to a measured piece; and solving and obtaining a Z parameter of the measured piece based on the first mathematical model, the second mathematical model and the third mathematical model, and acquiring an S parameter of the measured piece according to the Z parameter of the measured piece.


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