Peng Luan

Title: Innovations by Peng Luan in On-Wafer Calibration Technologies

Introduction

Peng Luan is a notable inventor based in Shijiazhuang, China. He has made significant contributions to the field of electronics, particularly in the area of on-wafer calibration technologies. With a total of 3 patents to his name, Luan's work is recognized for its innovative approaches to improving measurement accuracy in electronic components.

Latest Patents

Luan's latest patents include a method for determining parameters in an on-wafer calibration piece model. This method involves constructing a model set that includes various on-wafer calibration piece models. It also includes measuring the calibration piece using a specialized S parameter measurement system calibrated through a multi-thread TRL calibration method in the Terahertz frequency band. The process allows for the calculation of parameters that represent crosstalk in the calibration pieces.

Another significant patent is the development of two-port on-wafer calibration piece circuit models and a method for determining their parameters. This method entails measuring a single-port model to obtain an S parameter, which is then used to calculate intrinsic capacitance values. Following this, the two-port model is measured to derive parasitic capacitance and resistance values, enhancing the understanding of circuit behavior at high frequencies.

Career Highlights

Peng Luan is currently employed at the 13th Research Institute of China Electronics Technology Group Corporation. His work at this institution has allowed him to collaborate with other talented professionals in the field, further advancing the research and development of electronic technologies.

Collaborations

Luan has worked alongside notable colleagues such as Aihua Wu and Yibang Wang. Their collaborative efforts have contributed to the successful development of innovative solutions in the realm of electronics.

Conclusion

Peng Luan's contributions to on-wafer calibration technologies demonstrate his expertise and commitment to advancing the field of electronics. His innovative patents reflect a deep understanding of complex electronic systems and their measurement techniques.