Yibang Wang

Title: Yibang Wang: Innovator in On-Wafer Calibration Technologies

Introduction

Yibang Wang is a prominent inventor based in Shijiazhuang, China. He has made significant contributions to the field of on-wafer calibration technologies, holding a total of five patents. His work focuses on improving measurement techniques in the terahertz frequency band, which is crucial for various electronic applications.

Latest Patents

Yibang Wang's latest patents include a method for determining parameters in an on-wafer calibration piece model. This method involves constructing a model set that includes multiple on-wafer calibration piece models. It also includes selecting a model, measuring the corresponding calibration piece using a specialized S parameter measurement system, and calculating parameters that represent crosstalk in the model. Another notable patent is the two-port on-wafer calibration piece circuit model and method for determining parameters. This method entails measuring a single-port model to obtain an S parameter, calculating intrinsic capacitance, and measuring the two-port model to derive parasitic capacitance and resistance values.

Career Highlights

Yibang Wang has worked at the 13th Research Institute of China Electronics Technology Group Corporation and the 13th Research Institute of China Electronics. His experience in these institutions has allowed him to develop innovative solutions in the field of electronics and calibration technologies.

Collaborations

Yibang Wang has collaborated with notable colleagues such as Aihua Wu and Faguo Liang. Their combined expertise has contributed to advancements in calibration methods and technologies.

Conclusion

Yibang Wang's contributions to on-wafer calibration technologies highlight his innovative spirit and dedication to advancing electronic measurement techniques. His patents reflect a deep understanding of the complexities involved in calibration processes, making him a key figure in this field.