Nampa, ID, United States of America

Jason M Johnson

This inventor holds 45 USPTO granted patents and 6 published patent applications and 1 EPO patent, primarily in Memory Technology. Top assignees: Micron Technology Incorporated, Lodestar Licensing Group LLC, Microa Technology, Inc.. Active years: 2013-2026.

USPTO Granted Patents = 45 

% Patents Active = 84.4

 

Average Co-Inventor Count = 2.2

ph-index = 11

Forward Citations = 354(Granted Patents)


Location History:

  • Meridian, ID (US) (2016)
  • Flower Mound, TX (US) (2013 - 2017)
  • Nampa, ID (US) (2019 - 2024)
  • Boise, ID (US) (2021 - 2024)

Company Filing History:


Years Active: 2013-2026

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Areas of Expertise:
Error Correction
Data Compression
Temperature Compensation
Memory Device Testing
Redundancy Array
Calibration Mechanism
Impedance Calibration
Fuse Error Detection
Refresh Control
Multi-Bank Refresh
Signal Timing
Test Mode Security
45 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Jason M Johnson

Introduction

Jason M Johnson, an accomplished inventor based in Nampa, ID, has made significant strides in the field of electronics and memory device technology. With an impressive portfolio comprising 32 patents, Johnson's innovative spirit and technical expertise continue to influence the industry.

Latest Patents

Among his latest inventions is the "Test Mode Security Circuit." This apparatus features a TM control circuit designed to receive and compare address information corresponding to a TM function against an authorized TM list stored within its memory. When a match is detected, it outputs a latch load signal pulse, with a TM latch circuit programming latches based on this information and the pulse signal. This development facilitates authorized test mode operations across various features of the apparatus.

Another noteworthy patent is related to "Systems and Methods for Testing Redundant Fuse Latches in a Memory Device." This innovation covers an electronic device that incorporates multiple memory elements, including redundant ones. It’s equipped with repair circuitry that remaps data to these elements upon failure, including latch testing circuitry that ensures the functionality of fuse latches. The selection circuitry within this design allows for targeted testing of specific fuse latches separately from others.

Career Highlights

Throughout his career, Johnson has held pivotal roles at leading companies such as Micron Technology Incorporated and Microa Technology, Inc. His experience at these institutions has helped refine his skills and elevate his contributions to the field of technology, particularly in memory systems.

Collaborations

Johnson has collaborated with notable professionals such as Yoshinori Fujiwara and Christopher Gordon Wieduwilt. These partnerships have fostered a creative environment that emphasizes innovative problem-solving and advances in electronic design.

Conclusion

Jason M Johnson exemplifies dedication and creativity in his work, leading to over three decades of innovations that push the boundaries of technology. His contributions, particularly in test mode security and memory device functionality, reflect a commitment to enhancing electronic systems and set a strong groundwork for future advancements in the sector.

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