The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 19, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

John F. Schreck, Boise, ID (US);

Jason M. Johnson, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/40 (2006.01); G11C 11/4091 (2006.01); G11C 11/4097 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4091 (2013.01); G11C 11/4097 (2013.01); G11C 29/1201 (2013.01); G11C 2029/1204 (2013.01);
Abstract

Embodiments of the disclosure are drawn to apparatuses and methods for repairing multiple bit lines with a same column select value. A memory mat may be bordered by a first gap and a second gap. Each gap includes sets of sense amplifiers and a redundant sense amplifier set. The sense amplifier sets are activated by an enable signal and share a column select (CS) signal in common. The redundant sense amplifier set is activated by a redundant enable signal separate from the enable signal. In some embodiments, the redundant sense amplifier sets are coupled to a redundant CS signal which is separate from the CS signal.


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