Janos Kirz

This inventor holds 50 USPTO granted patents and 9 published patent applications and 6 EPO patents, primarily in X-Ray Imaging. Top assignee: Sigray, Inc.. Active years: 2016-2025.

USPTO Granted Patents = 50 (Patent Applications = 9)

% Patents Active = 92.0

EPO Patents = 6 (Patent Applications = 8)

Average Co-Inventor Count = 3.6

ph-index = 20

Forward Citations = 897(Granted Patents)

Company Filing History:

50 out of 51

Sigray, Inc.

patents

Years Active: 2016-2025

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Areas of Expertise:

X-Ray Imaging

Fluorescence Analysis

Spectroscopy

Microfocus X-Ray

3D Imaging

Detector Systems

Laminography

X-Ray Microscopy

Bragg Diffractors

Interferometric Imaging

High Flux X-Rays

Energy-Resolving Detection

50 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12510677 - Sequential array of x-ray imaging detectors (2025-12-30),

2. 12480892 - High throughput 3D x-ray imaging system using a transmission x-ray source (2025-11-25),

3. 12431256 - System and method for generating a focused x-ray beam (2025-09-30),

4. 12429437 - System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes (2025-09-30),

5. 12429436 - X-ray analysis system with focused x-ray beam and non-x-ray microscope (2025-09-30),

6. 12360067 - X-ray fluorescence system and x-ray source with electrically insulative target material (2025-07-15),

7. 12278080 - Microfocus x-ray source for generating high flux low energy x-rays (2025-04-14),

8. 12209977 - X-ray detector system with at least two stacked flat Bragg diffractors (2025-01-28),

9. 12153001 - High throughput 3D x-ray imaging system using a transmission x-ray source (2024-11-26),

10. 11992350 - System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector (2024-05-28),

11. 11885755 - X-ray sequential array wavelength dispersive spectrometer (2024-01-30),

12. 11686692 - High throughput 3D x-ray imaging system using a transmission x-ray source (2023-06-27),

13. 11549895 - System and method using x-rays for depth-resolving metrology and analysis (2023-01-10),

14. 11428651 - System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements (2022-08-30),

15. 11217357 - X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles (2022-01-04),

Title: Janos Kirz - Innovator in Berkeley

Introduction: Janos Kirz is a renowned inventor based in Berkeley, CA, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Janos Kirz holds several patents in the areas of optics, imaging, and spectroscopy, showcasing his expertise and innovative mindset in developing cutting-edge solutions.

Career Highlights: With a career spanning over three decades, Janos Kirz has worked tirelessly to push the boundaries of scientific research, leading to significant advancements in various industries.

Collaborations: Throughout his career, Janos Kirz has collaborated with leading research institutions, universities, and companies worldwide, fostering a culture of innovation and knowledge sharing.

Conclusion: Janos Kirz's passion for innovation and his dedication to creating impactful solutions have solidified his reputation as a pioneering inventor in Berkeley and beyond.