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For the Inventor, By the Inventor

Berkeley, CA, United States of America

Janos Kirz

USPTO Granted Patents = 49 

 

Average Co-Inventor Count = 3.6

ph-index = 20

Forward Citations = 871(Granted Patents)


Company Filing History:

goldMedal49 out of 50 
 
Sigray, Inc.
 patents

Years Active: 2016-2025

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Areas of Expertise:
X-Ray Imaging
X-Ray Spectroscopy
Microfocus X-Ray Source
X-Ray Detector Systems
X-Ray Fluorescence
Computed Laminography
X-Ray Interferometric Imaging
High Brightness X-Ray Sources
X-Ray Surface Analysis
Depth-Resolving Metrology
X-Ray Mirror Optics
Energy-Resolving X-Ray Detection
49 patents (USPTO):Explore Patents
1. 12480892 - High throughput 3D x-ray imaging system using a transmission x-ray source (2025-11-25),
2. 12431256 - System and method for generating a focused x-ray beam (2025-09-30),
3. 12429437 - System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes (2025-09-30),
4. 12429436 - X-ray analysis system with focused x-ray beam and non-x-ray microscope (2025-09-30),
5. 12360067 - X-ray fluorescence system and x-ray source with electrically insulative target material (2025-07-15),
6. 12278080 - Microfocus x-ray source for generating high flux low energy x-rays (2025-04-14),
7. 12209977 - X-ray detector system with at least two stacked flat Bragg diffractors (2025-01-28),
8. 12153001 - High throughput 3D x-ray imaging system using a transmission x-ray source (2024-11-26),
9. 11992350 - System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector (2024-05-28),
10. 11885755 - X-ray sequential array wavelength dispersive spectrometer (2024-01-30),
11. 11686692 - High throughput 3D x-ray imaging system using a transmission x-ray source (2023-06-27),
12. 11549895 - System and method using x-rays for depth-resolving metrology and analysis (2023-01-10),
13. 11428651 - System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements (2022-08-30),
14. 11217357 - X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles (2022-01-04),
15. 11215572 - System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements (2022-01-04),

Title: Janos Kirz - Innovator in Berkeley

Introduction: Janos Kirz is a renowned inventor based in Berkeley, CA, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Janos Kirz holds several patents in the areas of optics, imaging, and spectroscopy, showcasing his expertise and innovative mindset in developing cutting-edge solutions.

Career Highlights: With a career spanning over three decades, Janos Kirz has worked tirelessly to push the boundaries of scientific research, leading to significant advancements in various industries.

Collaborations: Throughout his career, Janos Kirz has collaborated with leading research institutions, universities, and companies worldwide, fostering a culture of innovation and knowledge sharing.

Conclusion: Janos Kirz's passion for innovation and his dedication to creating impactful solutions have solidified his reputation as a pioneering inventor in Berkeley and beyond.

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