For the Inventor, By the Inventor

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Concord, CA, United States of America

Sigray, Inc.

USPTO Granted Patents = 51

EPO Patents = 6

Forward Citations = 894

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16 inventors (with patents filed for the assignee):

Wenbing Yun (51 out of 93 patents)

Janos Kirz (50 out of 50 patents)

Sylvia Jia Yun Lewis (43 out of 43 patents)

4. Benjamin Donald Stripe (11 out of 11 patents)

5. Srivatsan Seshadri (9 out of 16 patents)

6. Alan Francis Lyon (8 out of 20 patents)

7. David Vine (7 out of 7 patents)

8. Sheraz Gul (5 out of 5 patents)

9. Richard Ian Spink (4 out of 5 patents)

10. Ruimin Qiao (3 out of 3 patents)

11. William Henry Hansen (3 out of 3 patents)

12. David Charles Reynolds (2 out of 2 patents)

13. Vikaram Singh (1 out of 1 patent)

14. Frances Yenan Su (1 out of 1 patent)

15. Thomas James Smart (1 out of 1 patent)

Core Competencies:

3D X-Ray Imaging

X-Ray Absorption Spectroscopy

Microfocus X-Ray Source

X-Ray Fluorescence

X-Ray Interferometric Imaging

High Brightness X-Ray Sources

X-Ray Spectrometer

Computed Laminography

X-Ray Detector Systems

X-Ray Surface Analysis

X-Ray Techniques

X-Ray Illumination Systems

51 patents: Sort by Forward Citations

1. 12510677 - Sequential array of x-ray imaging detectors (2025-12-30),

2. 12480892 - High throughput 3D x-ray imaging system using a transmission x-ray source (2025-11-25),

3. 12431256 - System and method for generating a focused x-ray beam (2025-09-30),

4. 12429437 - System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes (2025-09-30),

5. 12429436 - X-ray analysis system with focused x-ray beam and non-x-ray microscope (2025-09-30),

6. 12360067 - X-ray fluorescence system and x-ray source with electrically insulative target material (2025-07-15),

7. 12278080 - Microfocus x-ray source for generating high flux low energy x-rays (2025-04-14),

8. 12209977 - X-ray detector system with at least two stacked flat Bragg diffractors (2025-01-28),

9. 12181423 - Secondary image removal using high resolution x-ray transmission sources (2024-12-31),

10. 12153001 - High throughput 3D x-ray imaging system using a transmission x-ray source (2024-11-26),

11. 11992350 - System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector (2024-05-28),

12. 11885755 - X-ray sequential array wavelength dispersive spectrometer (2024-01-30),

13. 11686692 - High throughput 3D x-ray imaging system using a transmission x-ray source (2023-06-27),

14. 11549895 - System and method using x-rays for depth-resolving metrology and analysis (2023-01-10),

15. 11428651 - System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements (2022-08-30),

Sigray, Inc. is a leading provider of advanced x-ray analytical solutions. They specialize in developing and manufacturing state-of-the-art x-ray sources, optics, detectors, and associated equipment. Sigray's innovative technology enables researchers and scientists to achieve breakthroughs in fields such as materials science, pharmaceuticals, semiconductors, and life sciences. With their cutting-edge products, Sigray aims to revolutionize x-ray analysis and empower customers with superior analytical capabilities.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

51 Patents

#6 in Concord, CA

#1,580 in California

#6,661 in US

#13,382 in the World

Concord, CA, United States of America

Sigray, Inc.

Forward Citations = 894

16 inventors:

Wenbing Yun (51 out of 93 patents)

Janos Kirz (50 out of 50 patents)

Sylvia Jia Yun Lewis (43 out of 43 patents)

4. Benjamin Donald Stripe (11 out of 11 patents)

5. Srivatsan Seshadri (9 out of 16 patents)

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