The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Feb. 12, 2024
Applicant:
Sigray, Inc., Concord, CA (US);
Inventors:
Wenbing Yun, Walnut Creek, CA (US);
Janos Kirz, Berkeley, CA (US);
Assignee:
Sigray, Inc., Concord, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20008 (2018.01); G01N 23/20091 (2018.01); G01N 23/207 (2018.01); G01N 23/2209 (2018.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 23/20091 (2013.01); G01N 23/2076 (2013.01); G01N 23/2209 (2018.02); G21K 1/06 (2013.01); G21K 1/062 (2013.01); G01N 2223/041 (2013.01); G01N 2223/0563 (2013.01); G01N 2223/0568 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/315 (2013.01);
Abstract
An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.