The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Nov. 05, 2024
Applicant:

Sigray, Inc., Concord, CA (US);

Inventors:

Wenbing Yun, Walnut Creek, CA (US);

Janos Kirz, Berkeley, CA (US);

Sylvia Jia Yun Lewis, San Francisco, CA (US);

Assignee:

Sigray, Inc., Benicia, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/085 (2018.01); G01N 23/207 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/085 (2018.02); G01N 23/2076 (2013.01); G01N 23/223 (2013.01); G01N 2223/041 (2013.01); G01N 2223/0563 (2013.01); G01N 2223/0568 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/304 (2013.01); G01N 2223/321 (2013.01); G01N 2223/501 (2013.01);
Abstract

An apparatus includes an x-ray source configured to generate x-rays, at least some of which impinge a sample and at least one diffractor configured to concurrently diffract at least some of the x-rays from the sample in a first direction and in a second direction substantially orthogonal to the first direction. The apparatus further includes at least one two-dimensional (2D) position-sensitive x-ray detector configured to receive at least some of the diffracted x-rays and to concurrently generate first spectral information of the x-rays diffracted in the first direction and second spectral information of the x-rays diffracted in the second direction. The apparatus further includes circuitry configured to receive the first and second spectral information and to generate a single x-ray absorption spectroscopy (XAS) spectrum using the first and second spectral information.


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