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For the Inventor, By the Inventor

Chandler, AZ, United States of America

James Edward Neeb

USPTO Granted Patents = 13

Average Co-Inventor Count = 2.0

ph-index = 5

Forward Citations = 57(Granted Patents)


Location History:

  • Chandler, AZ (US) (2000 - 2017)
  • Gilbert, AZ (US) (2016 - 2023)

Company Filing History:

goldMedal12 out of 54,664 
 
Intel Corporation
 patents
silverMedal1 out of 6 
 
Intel Corportion
 patents

Years Active: 2000-2023

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13 patents (USPTO):
1. 11598804 - Debug tool for test instruments coupled to a device under test (2023-03-07),
2. 11193975 - Compressed test patterns for a field programmable gate array (2021-12-07),
3. 9886401 - Bus for communication between devices (2018-02-06),
4. 9869714 - Integrated circuit test temperature control mechanism (2018-01-16),
5. 9548284 - Reduced expansion thermal compression bonding process bond head (2017-01-17),
6. 9454499 - Asynchronous communication between devices (2016-09-27),
7. 9400291 - Integrated circuit test temperature control mechanism (2016-07-26),
8. 6898852 - Connector assembly with decoupling capacitors (2005-05-31),
9. 6766486 - Joint test action group (JTAG) tester, such as to test integrated circuits in parallel (2004-07-20),
10. 6621287 - Connector assembly with decoupling capacitors (2003-09-16),
11. 6559673 - Apparatus and method for power continuity testing in a parallel testing system (2003-05-06),
12. 6441637 - Apparatus and method for power continuity testing in a parallel testing system (2002-08-27),
13. 6163161 - Directed self-heating for reduction of system test time (2000-12-19),

Title: The Innovative Contributions of James Edward Neeb

Introduction

James Edward Neeb is a notable inventor based in Chandler, AZ (US), recognized for his significant contributions to technology and engineering. With a total of 13 patents to his name, Neeb has made a lasting impact in the field of test instruments and field programmable gate arrays.

Latest Patents

Among his latest patents is a "Debug tool for test instruments coupled to a device under test." This invention focuses on receiving and analyzing data captured by multiple test instruments, allowing for a graphical display of the analyzed data to users. Another significant patent is for "Compressed test patterns for a field programmable gate array." This invention involves compressing test patterns onto a field programmable gate array to efficiently test devices under test, enhancing the testing process through innovative data management.

Career Highlights

Neeb has had a distinguished career, working with prominent companies such as Intel Corporation. His experience in these leading technology firms has allowed him to develop and refine his innovative ideas, contributing to advancements in testing technologies.

Collaborations

Throughout his career, Neeb has collaborated with talented individuals, including Bradly L Inman and Nathan S Blackwell. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

James Edward Neeb's contributions to the field of technology through his patents and collaborations highlight his role as an influential inventor. His work continues to inspire advancements in testing instruments and methodologies.

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