The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Jun. 18, 2002
James E. Neeb, Chandler, AZ (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Multiple devices can be tested simultaneously for power continuity or for other power performance characteristic(s). If any of the devices have short circuit defects, for example, the fuse devices connected between these defective devices and a single power supply restrict the amount of current drawn by the defective devices. This allows power continuity testing to continue for all of the other devices. At the same time, the reduced voltage level of the defective devices, caused by the restriction of current by their corresponding fuse device, can be detected by the voltage measurement device. The reduced voltage levels allow the defective devices to be identified by a test control apparatus and to be excluded from subsequent testing.