I-Jen Huang

Title: I-Jen Huang: Innovator in Semiconductor Technology

Introduction

I-Jen Huang is a prominent inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 7 patents. His work focuses on innovative methods and structures that enhance the efficiency and reliability of semiconductor devices.

Latest Patents

One of Huang's latest patents is titled "Method and system for detecting defects of wafer by wafer sort." This invention introduces a method for detecting defects in wafers using a wafer sort testing apparatus. The method highlights repaired sites based on DTL or ADART results, allowing for precise identification of defects. Another notable patent is "Structure of ECC spare bits in 3D memory." This patent describes a 3D memory structure that includes multiple stacking layers and cells designed for storing information data and ECC spare bits. The innovative design allows for simultaneous reading of both groups of cells, enhancing the error-checking capabilities of the memory.

Career Highlights

I-Jen Huang is currently employed at Macronix International Co., Ltd., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Huang has collaborated with notable colleagues, including Nian-Kai Zous and Yung-Feng Lin, contributing to various projects that push the boundaries of semiconductor technology.

Conclusion

I-Jen Huang's contributions to semiconductor technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for future innovations.