Company Filing History:
Years Active: 2006-2024
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Title: The Innovative Work of Hoite Pieter Theodoor Tolsma
Introduction:
Hoite Pieter Theodoor Tolsma, a talented inventor based in Eindhoven, NL, has made significant contributions in the field of measuring properties of substrates. With a total of 19 patents to his name, Tolsma has revolutionized the industry with his groundbreaking methods and apparatus.
Latest Patents:
Tolsma's latest patents focus on methods and apparatus for measuring various properties of wafer substrates. One such invention involves the creation of a sampling plan that defines measurements for a property of a substrate. This plan includes sub-sampling plans and controls inspection apparatus to conduct measurements on multiple substrates. The results can be stacked to recompose the measurement data according to the sampling plan.
Career Highlights:
Tolsma is associated with ASML Netherlands B.V., a leading company in the semiconductor industry. His expertise and innovative mindset have played a crucial role in the development of advanced technologies for measuring substrate properties. Tolsma's dedication to his work has led to the successful implementation of various cutting-edge solutions.
Collaborations:
Throughout his career, Tolsma has collaborated with esteemed colleagues such as Franciscus Bernardus Maria Van Bilsen and Andre Bernardus Jeunink. Together, they have worked on projects that have pushed the boundaries of what is possible in the field of substrate measurement.
Conclusion:
In conclusion, Hoite Pieter Theodoor Tolsma stands out as a visionary inventor who has made remarkable strides in the measurement of substrate properties. His pioneering work continues to shape the industry and inspire future innovations in this field. With a strong foundation of 19 patents and a history of collaboration with industry experts, Tolsma remains a driving force behind technological advancements in substrate measurement.
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