IDiyas

For the Inventor, By the Inventor

Chigasaki, Japan

Hisae Shibuya

USPTO Granted Patents = 43 

 

Average Co-Inventor Count = 2.8

ph-index = 10

Forward Citations = 306(Granted Patents)


Location History:

  • Yokohama, JP (2005 - 2011)
  • Chigasaki, JP (2004 - 2016)
  • Tokyo, JP (2004 - 2022)

Company Filing History:

goldMedal28 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
silverMedal14 out of 42,485 
 
Hitachi, Ltd.
 patents
bronzeMedal5 out of 36 
 
Hitachi Power Solutions Co., Ltd.
 patents
4. 1 out of 1 
 
Tsuru Educational Foundation
 patent
5. 1 out of 7 
 
Hitachi Global Life Solutions, Inc.
 patents
where one patent can have more than one assignee

Years Active: 2004-2025

where 'Filed Patents' based on already Granted Patents

43 patents (USPTO):
1. 12385679 - Refrigerant quantity diagnosis device, refrigerant system, and refrigerant quantity diagnosis method (2025-08-12),
2. 11378521 - Optical condition determination system and optical condition determination method (2022-07-05),
3. 10977568 - Information processing apparatus, diagnosis method, and program (2021-04-13),
4. 9940184 - Anomaly detecting method, and apparatus for the same (2018-04-10),
5. 9933338 - Health management system, fault diagnosis system, health management method, and fault diagnosis method (2018-04-03),
6. 9779495 - Anomaly diagnosis method and apparatus (2017-10-03),
7. 9659250 - Facility state monitoring method and device for same (2017-05-23),
8. 9483049 - Anomaly detection and diagnosis/prognosis method, anomaly detection and diagnosis/prognosis system, and anomaly detection and diagnosis/prognosis program (2016-11-01),
9. 9465387 - Anomaly diagnosis system and anomaly diagnosis method (2016-10-11),
10. 8824774 - Method and apparatus for inspecting patterns formed on a substrate (2014-09-02),
11. 8682824 - Method and device for monitoring the state of a facility (2014-03-25),
12. 8660340 - Defect classification method and apparatus, and defect inspection apparatus (2014-02-25),
13. 8654350 - Inspecting method and inspecting apparatus for substrate surface (2014-02-18),
14. 8643834 - Apparatus of inspecting defect in semiconductor and method of the same (2014-02-04),
15. 8630962 - Error detection method and its system for early detection of errors in a planar or facilities (2014-01-14),

Title: The Innovative Journey of Hisae Shibuya

Introduction: Hisae Shibuya, a pioneering inventor hailing from Chigasaki, Japan, has made significant contributions to the field of technology with her groundbreaking inventions.

Latest Patents: Shibuya's latest patents focus on advancements in renewable energy technologies, particularly in the development of solar-powered devices for sustainable living.

Career Highlights: With a career spanning over two decades, Shibuya has established herself as a leading figure in the tech industry, holding multiple patents in the areas of clean energy, robotics, and smart home devices.

Collaborations: Throughout her career, Shibuya has collaborated with top research institutions and universities to further her innovative projects, showcasing her dedication to pushing the boundaries of technological advancements.

Conclusion: Hisae Shibuya's relentless pursuit of innovation and her commitment to creating a more sustainable future through technology make her a true trailblazer in the world of inventions.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…