The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Dec. 12, 2014
Hitachi High-technologies Corporation, Tokyo, JP;
Hitachi Power Solutions Co., Ltd., Ibaraki, JP;
Hisae Shibuya, Tokyo, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
HITACHI POWER SOLUTIONS CO., LTD., Ibaraki, JP;
Abstract
In an anomaly detecting method by using multi-dimensional time series sensor signals including, generating anomaly model by using data of a learning period including neither that period nor any exclusion candidate period, calculating anomaly measurements on the basis of the distance from the normal model and, making a period containing the maximum anomaly measurement value but no exclusion candidate period, learning exclusion periods and anomaly determining thresholds are determined as learned data on the basis of the result in each round, generates anomaly model data in a learning period except learning-exclusion periods regarding acquired data or data in a designated evaluation period, an anomaly measurement at each time point is calculated on the basis of the distance from the normal model, and data at each time point is determined to be anomaly or normal by comparing the anomaly measurements with anomaly determining thresholds.