logo

For the Inventor, By the Inventor

Yokohama, Japan

Hiroyuki Nakano

This inventor holds 79 USPTO granted patents and 5 published patent applications and 2 EPO patents, primarily in Optical Transmission (CPC class 3591). Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi Communication Technologies, Ltd.. Active years: 1996-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Nakano. Retrieved from https://idiyas.com/inventor/hiroyuki-nakano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 79 

% Patents Active = 40.5

 

Average Co-Inventor Count = 3.0

ph-index = 10

Forward Citations = 455(Granted Patents)

Forward Citations (Not Self Cited) = 381(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Asaka, JP (1996 - 2007)
  • Chigasaki, JP (2008 - 2013)
  • Yokohama, JP (1998 - 2014)
  • Mito, JP (2012 - 2014)

Company Filing History:

goldMedal45 out of 42,731 
 
Hitachi, Ltd.
 patents
silverMedal23 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal8 out of 129 
 
Hitachi Communication Technologies, Ltd.
 patents
4. 1 out of 155 
 
Hitachi-Ge Nuclear Energy, Ltd.
 patents
5. 1 out of 16,602 
 
Mitsubishi Electric Corporation
 patents
6. 1 out of 3,781 
 
Renesas Technology Corp.
 patents

Years Active: 1996-2025

Loading Chart...
Loading Chart...
Areas of Expertise:
Defect Inspection
Optical Transmission
Pattern Detection
Ultrasonic Inspection
Wavelength-Division Multiplexing
Dispersion Compensation
Signal Speed Conversion
Optical Amplifiers
Circuit Board Production
Control Method
Transmission Equipment
Particle Detection
79 patents (USPTO):Explore Patents
1. 12230548 - Semiconductor device (2025-02-18),
2. 8748795 - Method for inspecting pattern defect and device for realizing the same (2014-06-10),
3. 8634069 - Defect inspection device and defect inspection method (2014-01-21),
4. 8616062 - Ultrasonic inspection system and ultrasonic inspection method (2013-12-31),
5. 8515287 - Optical transmission equipment and method for controlling thereof (2013-08-20),
6. 8462330 - Method and apparatus for detecting defects (2013-06-11),
7. 8411264 - Method and apparatus for inspecting defects (2013-04-02),
8. 8289507 - Method of apparatus for detecting particles on a specimen (2012-10-16),
9. 8218138 - Apparatus and method for inspecting defects (2012-07-10),
10. 8121398 - Method and apparatus for inspecting defects (2012-02-21),
11. 8107065 - Method and apparatus for detecting defects (2012-01-31),
12. 8041213 - Optical transmission equipment and optical network (2011-10-18),
13. 7973920 - Apparatus and method for inspecting defects (2011-07-05),
14. 7953321 - Optical transmission equipment and optical add-drop multiplexer (2011-05-31),
15. 7952700 - Method of apparatus for detecting particles on a specimen (2011-05-31),

Title: The Innovative Journey of Hiroyuki Nakano

Introduction: Hiroyuki Nakano, a pioneering inventor hailing from Yokohama, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Nakano's recent patents showcase his expertise in the field of robotics, with a focus on developing advanced AI algorithms for autonomous systems.

Career Highlights: With a career spanning over two decades, Nakano has worked with leading tech companies in Japan, honing his skills in artificial intelligence, machine learning, and robotics. His innovative solutions have revolutionized industries such as manufacturing, healthcare, and transportation.

Collaborations: Nakano has collaborated with top research institutions and universities in Japan, fostering a culture of innovation and knowledge sharing. His partnerships have led to the development of cutting-edge technologies that have garnered international acclaim.

Conclusion: Hiroyuki Nakano's relentless pursuit of innovation and his passion for pushing the boundaries of technology have solidified his position as a visionary inventor in the global tech landscape. His contributions continue to inspire future generations of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…