The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Feb. 16, 2011
Naoyuki Kono, Mito, JP;
Isao Yoshida, Iwaki, JP;
Masahiro Koike, Hitachi, JP;
Yoshio Nonaka, Mito, JP;
Hiroyuki Nakano, Mito, JP;
Kenichi Otani, Hitachi, JP;
Chihiro Matsuoka, Hitachi, JP;
Masafumi Imai, Hitachiota, JP;
Naoyuki Kono, Mito, JP;
Isao Yoshida, Iwaki, JP;
Masahiro Koike, Hitachi, JP;
Yoshio Nonaka, Mito, JP;
Hiroyuki Nakano, Mito, JP;
Kenichi Otani, Hitachi, JP;
Chihiro Matsuoka, Hitachi, JP;
Masafumi Imai, Hitachiota, JP;
Hitachi-GE Nuclear Energy, Ltd., Ibaraki, JP;
Abstract
In an ultrasonic inspection method or ultrasonic inspection system in which an ultrasonic wave is propagated to an test object via a medium such as a liquid or a gas, an incident position of the ultrasonic wave is accurately and reliably identified. In an ultrasonic inspection method based on an immersion technique, an optical irradiator is mounted on an ultrasonic wave transmitting/receiving unit, an optical marker is irradiated from the optical irradiator to the test object, and an irradiated position of the optical marker is imaged using imaging equipment in order to perform inspection.