Chiba, Japan

Hiroyoshi Yamamoto

This inventor holds 17 USPTO granted patents, primarily in Scanning Probe Microscopy. Top assignees: Hitachi High-Tech Science Corporation, Seiko Instruments Inc, Sii Nanotechnology Inc.. Active years: 1988-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyoshi Yamamoto. Retrieved from https://idiyas.com/inventor/hiroyoshi-yamamoto-r7d183tk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 76.5

Average Co-Inventor Count = 2.1

ph-index = 6

Forward Citations = 80(Granted Patents)


Location History:

  • Chiba, JP (2002 - 2013)
  • Tokyo, JP (1988 - 2022)

Company Filing History:


Years Active: 1988-2022

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Areas of Expertise:
Scanning Probe Microscope
Optical Displacement Detection
Probe Alignment Method
Atomic Force Microscope
Surface Information Measurement
Optical Waveguide Coupler
Optical Attenuator
Actuating Objective Lens
17 patents (USPTO):Explore Patents

Title: Hiroyoshi Yamamoto: Innovator in Scanning Probe Microscopy

Introduction

Hiroyoshi Yamamoto is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of scanning probe microscopy, holding a total of 17 patents. His work focuses on enhancing measurement techniques and reducing the time required for precise measurements.

Latest Patents

Yamamoto's latest patents include innovative designs for scanning probe microscopes. One notable patent is for a scanning probe microscope and setting method that significantly reduces the time taken for measuring. This invention features a movement driving unit that allows for relative movement between a cantilever and a sample in at least a z direction. The control device operates an approach operation, ensuring that the cantilever and sample come into contact at a predetermined speed, while preventing excessive force during contact.

Another significant patent involves a scanning probe microscope designed to avoid overload on both the probe and the sample surface. This invention utilizes an intermittent measurement method to scan irregular shapes on the sample surface. The control device in this microscope performs operations to bring the probe into contact with the sample surface and then separates them by thermally deforming the cantilever.

Career Highlights

Throughout his career, Hiroyoshi Yamamoto has worked with notable companies such as Seiko Instruments Inc. and Sii Nanotechnology Inc. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.

Collaborations

Yamamoto has collaborated with esteemed colleagues, including Kazutoshi Watanabe and Masatsugu Shigeno. These partnerships have fostered innovation and the advancement of technology in their respective fields.

Conclusion

Hiroyoshi Yamamoto's contributions to scanning probe microscopy have made a lasting impact on measurement techniques. His innovative patents and collaborations highlight his dedication to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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