This inventor holds 17 USPTO granted patents, primarily in Scanning Probe Microscopy. Top assignees: Hitachi High-Tech Science Corporation, Seiko Instruments Inc, Sii Nanotechnology Inc.. Active years: 1988-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Chiba, JP (2002 - 2013)
- Tokyo, JP (1988 - 2022)
Company Filing History:


Years Active: 1988-2022
Areas of Expertise:
Title: Hiroyoshi Yamamoto: Innovator in Scanning Probe Microscopy
Introduction
Hiroyoshi Yamamoto is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of scanning probe microscopy, holding a total of 17 patents. His work focuses on enhancing measurement techniques and reducing the time required for precise measurements.
Latest Patents
Yamamoto's latest patents include innovative designs for scanning probe microscopes. One notable patent is for a scanning probe microscope and setting method that significantly reduces the time taken for measuring. This invention features a movement driving unit that allows for relative movement between a cantilever and a sample in at least a z direction. The control device operates an approach operation, ensuring that the cantilever and sample come into contact at a predetermined speed, while preventing excessive force during contact.
Another significant patent involves a scanning probe microscope designed to avoid overload on both the probe and the sample surface. This invention utilizes an intermittent measurement method to scan irregular shapes on the sample surface. The control device in this microscope performs operations to bring the probe into contact with the sample surface and then separates them by thermally deforming the cantilever.
Career Highlights
Throughout his career, Hiroyoshi Yamamoto has worked with notable companies such as Seiko Instruments Inc. and Sii Nanotechnology Inc. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.
Collaborations
Yamamoto has collaborated with esteemed colleagues, including Kazutoshi Watanabe and Masatsugu Shigeno. These partnerships have fostered innovation and the advancement of technology in their respective fields.
Conclusion
Hiroyoshi Yamamoto's contributions to scanning probe microscopy have made a lasting impact on measurement techniques. His innovative patents and collaborations highlight his dedication to advancing technology in this field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile