The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2002
Filed:
Mar. 15, 2000
Hiroyoshi Yamamoto, Chiba, JP;
Seiko Instruments Inc., , JP;
Abstract
A scanning probe microscope having a cantilever probe is provided with a probe supply mechanism for supplying cantilever probes to a probe attaching portion of the microscope. The cantilever probes are held by the probe supply mechanism by an elastic material. The microscope has a controller for performing a cantilever attaching operation by causing the cantilever attaching portion to come into contact with a cantilever probe held by the probe supply mechanism and to further approach the cantilever attaching portion to compress the elastic material so that the cantilever probe becomes firmly attached to the cantilever attaching portion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile