The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1995
Filed:
Mar. 25, 1994
Seiko Instruments Inc., Tokyo, JP;
Abstract
A probe microscope has a displacement detecting system formed of a spring element and a photodetecting element, the system being attached to a fine movement element, and a holder, which attached to the spring element fixed to the photodetecting system by a magnetic force, is moved by an alignment jig removably mounted on a sample moving stage in a three-dimensional fashion and a laser beam is converged on a selected point of the spring element with ease while confirming the state of alignment of the spring element with laser light based on an image produced by a camera and displayed on a monitor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile