Average Co-Inventor Count = 3.0

ph-index = 6

Forward Citations = 112(Granted Patents)

Location History:

Chiba, JP (1995 - 2013)
Tokyo, JP (1989 - 2017)

Company Filing History:

7 out of 223

Sii Nanotechnology Inc.

patents

6 out of 2,899

Seiko Instruments Inc

patents

2 out of 1,037

Agency of Industrial Science and Technology

patents

4. 1 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

patents

5. 1 out of 223

Hitachi High-tech Science Corporation

patents

6. 5 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 1989-2017

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19 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9766267 - Actuator position calculation device, actuator position calculation method, and actuator position calculation program (2017-09-19),

2. 8495759 - Probe aligning method for probe microscope and probe microscope operated by the same (2013-07-23),

3. 7945964 - Apparatus structure and scanning probe microscope including apparatus structure (2011-05-17),

4. 7378654 - Processing probe (2008-05-27),

5. 7373806 - Scanning probe microscope and scanning method (2008-05-20),

6. 7278299 - Method of processing vertical cross-section using atomic force microscope (2007-10-09),

7. 7259372 - Processing method using probe of scanning probe microscope (2007-08-21),

8. 7232995 - Method of removing particle of photomask using atomic force microscope (2007-06-19),

9. 6388249 - Surface analyzing apparatus (2002-05-14),

10. 6355495 - Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof (2002-03-12),

11. 6259093 - Surface analyzing apparatus (2001-07-10),

12. 6255127 - Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same (2001-07-03),

13. 6184519 - Surface analyzing apparatus with anti-vibration table (2001-02-06),

14. 6124142 - Method for analyzing minute foreign substance elements (2000-09-26),

15. 5877035 - Analyzing method and apparatus for minute foreign substances, and (1999-03-02),

Title: Shigeru Wakiyama - Innovative Inventor from Chiba, Japan

Introduction: Shigeru Wakiyama is a renowned inventor hailing from Chiba, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Shigeru Wakiyama holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Wakiyama has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Shigeru Wakiyama has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange.

Conclusion: Shigeru Wakiyama's passion for innovation, coupled with his dedication to pushing the boundaries of technology, has solidified his reputation as a pioneering inventor in Chiba, Japan, and beyond.

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Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.