Company Filing History:

7 out of 223

Sii Nanotechnology Inc.

patents

6 out of 2,899

Seiko Instruments Inc

patents

2 out of 1,037

Agency of Industrial Science and Technology

patents

4. 1 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

patents

5. 1 out of 223

Hitachi High-tech Science Corporation

patents

6. 5 out of 832,880

Other

patents

where one patent can have more than one assignee

Years Active: 1989-2017

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19 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9766267 - Actuator position calculation device, actuator position calculation method, and actuator position calculation program (2017-09-19),

2. 8495759 - Probe aligning method for probe microscope and probe microscope operated by the same (2013-07-23),

3. 7945964 - Apparatus structure and scanning probe microscope including apparatus structure (2011-05-17),

4. 7378654 - Processing probe (2008-05-27),

5. 7373806 - Scanning probe microscope and scanning method (2008-05-20),

6. 7278299 - Method of processing vertical cross-section using atomic force microscope (2007-10-09),

7. 7259372 - Processing method using probe of scanning probe microscope (2007-08-21),

8. 7232995 - Method of removing particle of photomask using atomic force microscope (2007-06-19),

9. 6388249 - Surface analyzing apparatus (2002-05-14),

10. 6355495 - Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof (2002-03-12),

11. 6259093 - Surface analyzing apparatus (2001-07-10),

12. 6255127 - Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same (2001-07-03),

13. 6184519 - Surface analyzing apparatus with anti-vibration table (2001-02-06),

14. 6124142 - Method for analyzing minute foreign substance elements (2000-09-26),

15. 5877035 - Analyzing method and apparatus for minute foreign substances, and (1999-03-02),

Title: Shigeru Wakiyama - Innovative Inventor from Chiba, Japan

Introduction: Shigeru Wakiyama is a renowned inventor hailing from Chiba, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Shigeru Wakiyama holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Wakiyama has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Shigeru Wakiyama has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange.

Conclusion: Shigeru Wakiyama's passion for innovation, coupled with his dedication to pushing the boundaries of technology, has solidified his reputation as a pioneering inventor in Chiba, Japan, and beyond.

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