Hirotami Koike

Title: Hirotami Koike: Innovator in Charged Particle Beam Technology

Introduction

Hirotami Koike is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 12 patents. His innovative work has advanced the capabilities of electron microscopy and charged particle beam apparatuses.

Latest Patents

Koike's latest patents include a charged particle beam reflector device and an electron microscope. The charged particle beam reflector device features at least two electrostatic mirrors arranged along a linear optical axis. These mirrors reflect or allow the charged particle beam to pass through based on the applied voltage. The device is controlled by a controller that applies reflection voltage to the mirrors, enabling multiple reflections of the charged particle beam. Additionally, his charged particle beam apparatus prevents specimen charging without requiring large-scale facilities. This apparatus includes a scanning electron microscope that illuminates specimens with a charged particle beam, incorporating a charge preventive member to enhance functionality.

Career Highlights

Throughout his career, Koike has worked with notable companies, including Topcon Corporation. His experience in these organizations has contributed to his expertise in charged particle beam technology and its applications.

Collaborations

Koike has collaborated with esteemed colleagues such as Shinichi Okada and Nobuo Kochi. Their joint efforts have furthered advancements in the field of electron microscopy and charged particle beam technologies.

Conclusion

Hirotami Koike's innovative contributions to charged particle beam technology and his extensive patent portfolio highlight his role as a leading inventor in this specialized field. His work continues to influence advancements in electron microscopy and related technologies.