Toyonaka, Japan

Hiroshi Yano


Average Co-Inventor Count = 3.6

ph-index = 3

Forward Citations = 75(Granted Patents)


Location History:

  • Kyoto, JP (2002)
  • Toyonaka, JP (2012 - 2014)

Company Filing History:


Years Active: 2002-2014

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10 patents (USPTO):Explore Patents

Title: Hiroshi Yano: A Pioneer in Three-Dimensional Measurement Technologies

Introduction

Hiroshi Yano, an esteemed inventor based in Toyonaka, Japan, has made significant strides in the field of three-dimensional measurement technologies. With an impressive portfolio of ten patents, Yano has demonstrated a strong commitment to innovation and problem-solving in his field.

Latest Patents

Among his latest contributions to technology are two notable patents that enhance three-dimensional measurement techniques. The first patent, titled "Method and apparatus for performing three-dimensional measurement," describes a control processing unit that drives cameras to create images of a measuring object. This system computes accurate three-dimensional coordinates by searching corresponding points on comparative images. It also evaluates measurement accuracy by supplying a shift amount as an evaluation value.

The second patent, "Three-dimensional measurement method and three-dimensional measurement apparatus," outlines a process where images of a workpiece are captured from multiple angles to measure specific height regions. Utilizing a three-dimensional coordinate system, the technique performs a perspective transformation to generate a processing result image that expresses measurement outcomes clearly, including height indicators to enhance user understanding.

Career Highlights

Hiroshi Yano has dedicated his career to advancing measurement technology. His role at Omron Corporation, a leader in automation and advanced technology solutions, reflects his commitment to innovation. Yano's patents significantly influence how industries approach precision measurement, making processes more efficient and accurate.

Collaborations

Throughout his career, Yano has collaborated with fellow innovators such as Shiro Fujieda and Yasuyuki Ikeda. Together, they have explored new frontiers in measurement technology, leveraging their combined expertise to bring cutting-edge solutions to market.

Conclusion

With a solid foundation in three-dimensional measurement technologies and a dedication to innovation, Hiroshi Yano continues to inspire through his patented inventions. As he leads advancements at Omron Corporation, his contributions will undoubtedly shape the future of various industries reliant on accurate measurement techniques.

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