The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Aug. 28, 2008
Shiro Fujieda, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Omron Corporation, Kyoto-shi, JP;
Abstract
Images of a work piece in which measurement object is restricted to a specific point or domain are taken by a camera which takes the image of the work piece from a front-view direction and a camera which takes the image from obliquely above, and a height of each measurement object region is measured. Each pixel of the front-view image used in measurement processing is virtually disposed in a three-dimensional coordinate system including x- and y-axes constituting a coordinate system of the image and a z-axis indicating the height, and a perspective transform is performed to produce a processing result image expressing measurement result. A measurement value is set as the z-coordinate at the pixel which is a height measurement object, and the z-coordinates of other pixels are set at other pixels. A mark for identifying a position and an auxiliary line indicating the height are set at measurement object points and measurement object region in the image.