The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Oct. 02, 2012
Omron Corporation, Kyoto, JP;
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Omron Corporation, Kyoto, JP;
Abstract
Enabling height recognition processing by setting a height of an arbitrary plane to zero for convenience of the recognition processing. A parameter for three-dimensional measurement is calculated and registered through calibration and, thereafter, an image pickup with a stereo camera is performed on a plane desired to be recognized as having a height of zero in actual recognition processing. Three-dimensional measurement using the registered parameter is performed on characteristic patterns (marks m, mand m) included in this plane. Based on a positional relationship between a plane defined as having a height of zero through the calibration and the plane expressed by the calculation equation, a transformation parameter (a homogeneous transformation matrix) for displacing points in the former plane into the latter plane is determined, and the registered parameter is changed using the transformation parameter.